Error: Contact form not found.
Imagine for a moment that you are trying out a brand new car: you slide into one of the ergonomic seats, start the engine and, to make things perfect, would like to listen to some music. But when you switch this on, you suddenly notice interesting side effects. The light comes on in the passenger compartment, for example. Or the radio starts whistling and whimpering.
These are relatively harmless phenomena. Much more serious problems could occur that may even jeopardise driving safety or impair the car’s functions.
High-frequency interferences are very tricky in modern electric automobiles, hybrid vehicles or complex electronic systems for the driver’s safety and comfort.
With the IC (integrated circuit) test system the developer tests the behavior of circuits during specific disturbances (conducted and radiated) or their emissions. The IC is tested in operation.
With the IC Test Environment, you can determine EMC parameters of an IC and assess the EMC strength of ICs.
The IC probes for emission allow for conducted RF measurements and measurements of RF field emission.
Measuring systems for the coupling of Burst, EFT, ESD and RF are available for conducted and radiated measurements of an IC`s immunity.
These probes allow for inject fast, transient magnetic field, E-field and current pulses into ICs.
The simulation models of our probes help to understand and combine EMC measurement and simulation.
